发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 A semiconductor device includes a substrate, a stack structure, peripheral gate structures and residual spacers. The substrate includes a cell array region and a peripheral circuit region. The stack structure is disposed on the cell array region, having electrodes and insulating layers alternately stacked. The peripheral gate structures are disposed on the peripheral circuit region, being spaced apart from each other in one direction and having a peripheral gate pattern disposed on the substrate, and a peripheral gate spacer disposed on a sidewall of the peripheral gate pattern. The residual spacers are disposed on sidewalls of the peripheral gate structures, having a sacrificial pattern and an insulating pattern that are stacked. The insulating pattern includes substantially the same material as the insulating layers of the stack structure.
申请公布号 US2016027795(A1) 申请公布日期 2016.01.28
申请号 US201514801470 申请日期 2015.07.16
申请人 JUNG WON-SEOK;KANG Changseok;PAEK SeungWoo;YANG lnseok;JOO Kyungjoong 发明人 JUNG WON-SEOK;KANG Changseok;PAEK SeungWoo;YANG lnseok;JOO Kyungjoong
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate including a cell array region and a peripheral circuit region; a stack structure disposed on the cell array region, the stack structure including a plurality of electrodes and a plurality of insulating layers alternately stacked; a plurality of peripheral gate structures disposed on the peripheral circuit region, the plurality of peripheral gate structures spaced apart from each other in one direction; and a plurality of residual spacers disposed on sidewalls of the plurality of peripheral gate structures, wherein each of the plurality of peripheral gate structures comprises: a peripheral gate pattern disposed on the substrate; anda peripheral gate spacer disposed on a sidewall of the peripheral gate pattern, wherein each of the plurality of residual spacers comprises: a sacrificial pattern andan insulating pattern that are stacked, and wherein the insulating pattern includes substantially the same material as the plurality of insulating layers of the stack structure.
地址 Anyang-si KR