发明名称 SEMICONDUCTOR DEVICE
摘要 To provide a semiconductor device with a wafer level package structure that allows for probing while reducing the area occupied by the pad electrodes.;[Solution] In the present invention, the following are provided: a semiconductor chip (100) that has first and second pad electrodes (120a, 120b) disposed on the main surface thereof; insulating films (310, 330) that cover the main surface of the semiconductor chip (100); a rewiring layer (320) that is disposed between the insulating films (310, 330); and a plurality of external terminals (340) disposed on the top of the insulating film (330). The plane size of the first pad electrode (120a) and the second pad electrode (120b) differ from one another, and the first pad electrode (120a) and the second pad electrode (120b) are connected to any of the plurality of external terminals (340) via the rewiring layer (320). According to the present invention, because the pad electrodes (120a, 120b) of different sizes are intermixed, probing can be easily performed while reducing the area occupied by the pad electrodes.
申请公布号 US2016027754(A1) 申请公布日期 2016.01.28
申请号 US201414773817 申请日期 2014.03.10
申请人 KATAGIRI Mitsuaki;HASEGAWA Yu;ISA Satoshi;PS4 Luxco S.a.r.l. 发明人 Katagiri Mitsuaki;Hasegawa Yu;Isa Satoshi
分类号 H01L23/00;H01L23/31;H01L23/48;H01L23/498 主分类号 H01L23/00
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor chip having a plurality of first pad electrodes and a plurality of second pad electrodes; and a wiring structure provided on the semiconductor chip, wherein the wiring structure includes a plurality of external terminals, a plurality of wiring patterns that electrically connect the plurality of external terminals and the plurality of first pad electrodes, and bridge wiring that is not electrically connected to any of the plurality of external terminals within the wiring structure, but that electrically connects the plurality of second pad electrodes in a shared fashion.
地址 Chuo-ku Tokyo JP