发明名称 |
FIELD EFFECT TRANSISTOR WITH CHANNEL CORE MODIFIED FOR A BACKGATE BIAS AND METHOD OF FABRICATION |
摘要 |
A semiconductor device, includes a substrate, a source structure and a drain structure formed on the substrate. At least one interconnect structure interconnects the source structure and the drain structure and serves as a channel therebetween. A gate structure is formed over the at least one interconnect structure to provide a control of a conductivity of carriers in the channel. Each of the interconnect structures include a center core serving as a backbias electrode for the channel. |
申请公布号 |
US2016027872(A1) |
申请公布日期 |
2016.01.28 |
申请号 |
US201514873581 |
申请日期 |
2015.10.02 |
申请人 |
Renesas Electronics Corporation |
发明人 |
HIRAI Tomohiro;NAGUMO Toshiharu |
分类号 |
H01L29/06;H01L29/423;H01L29/66;H01L29/78;H01L21/283;H01L29/45;H01L29/16;H01L29/161;H01L21/306;H01L29/10;H01L29/786 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a substrate; a source structure and a drain structure formed on said substrate; at least one interconnect structure interconnecting said source structure and said drain structure and serving as a channel therebetween; and a gate structure formed over said at least one interconnect structure to provide a control of a conductivity of carriers in said channel, wherein each of said at least one interconnect structure includes a center core serving as a backbias electrode for said channel. |
地址 |
Kawasaki-shi JP |