发明名称 THIN FILM TRANSISTOR SUBSTRATE, DISPLAY DEVICE HAVING THE SAME AND METHOD OF MANUFACTURING THE SAME
摘要 A thin film transistor substrate includes a semiconductor pattern on a base substrate, a first insulation member disposed on the semiconductor pattern, a second insulation pattern disposed on the first insulation member, and a gate electrode disposed on the first insulation member and the second insulation pattern. The second insulation pattern overlaps a first end portion of the semiconductor pattern, and exposes a second end portion of the semiconductor pattern opposite to the first end portion. The gate electrode overlaps both the first insulation member and the second insulation pattern.
申请公布号 US2016027856(A1) 申请公布日期 2016.01.28
申请号 US201514877044 申请日期 2015.10.07
申请人 Samsung Display Co., Ltd. 发明人 KWON Do-Hyun;LEE Min-Jung;LEE Sung-Eun;LEE Il-Jeong;LEE Jung-Kyu;CHOI Kwang-Young
分类号 H01L27/32 主分类号 H01L27/32
代理机构 代理人
主权项 1. A method of manufacturing a thin film transistor substrate, comprising: sequentially forming a semiconductor layer, a first insulation layer and a second insulation layer, on a base substrate; forming a first photoresist pattern on the second insulation layer and having a first thickness portion, and a second thickness portion thinner than the first thickness portion; removing exposed portions of the second insulation layer, the first insulation layer and the semiconductor layer using the first photoresist pattern as a mask, to form an intermediate insulation pattern, a first insulation pattern and a semiconductor pattern from the second insulation layer, the first insulation layer and the semiconductor layer, respectively; reducing an entirety of the first photoresist pattern by a thickness of the second thickness portion, to form a second photoresist pattern having a third thickness and expose a portion of the intermediate insulation pattern; removing the exposed portion of the intermediate insulation pattern using the second photoresist pattern as a mask, to form a second insulation pattern from the intermediate insulation pattern; and forming a gate electrode on and overlapping both the first insulation pattern and the second insulation pattern.
地址 Yongin-City KR