发明名称 |
THIN FILM TRANSISTOR SUBSTRATE, DISPLAY DEVICE HAVING THE SAME AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A thin film transistor substrate includes a semiconductor pattern on a base substrate, a first insulation member disposed on the semiconductor pattern, a second insulation pattern disposed on the first insulation member, and a gate electrode disposed on the first insulation member and the second insulation pattern. The second insulation pattern overlaps a first end portion of the semiconductor pattern, and exposes a second end portion of the semiconductor pattern opposite to the first end portion. The gate electrode overlaps both the first insulation member and the second insulation pattern. |
申请公布号 |
US2016027856(A1) |
申请公布日期 |
2016.01.28 |
申请号 |
US201514877044 |
申请日期 |
2015.10.07 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
KWON Do-Hyun;LEE Min-Jung;LEE Sung-Eun;LEE Il-Jeong;LEE Jung-Kyu;CHOI Kwang-Young |
分类号 |
H01L27/32 |
主分类号 |
H01L27/32 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a thin film transistor substrate, comprising:
sequentially forming a semiconductor layer, a first insulation layer and a second insulation layer, on a base substrate; forming a first photoresist pattern on the second insulation layer and having a first thickness portion, and a second thickness portion thinner than the first thickness portion; removing exposed portions of the second insulation layer, the first insulation layer and the semiconductor layer using the first photoresist pattern as a mask, to form an intermediate insulation pattern, a first insulation pattern and a semiconductor pattern from the second insulation layer, the first insulation layer and the semiconductor layer, respectively; reducing an entirety of the first photoresist pattern by a thickness of the second thickness portion, to form a second photoresist pattern having a third thickness and expose a portion of the intermediate insulation pattern; removing the exposed portion of the intermediate insulation pattern using the second photoresist pattern as a mask, to form a second insulation pattern from the intermediate insulation pattern; and forming a gate electrode on and overlapping both the first insulation pattern and the second insulation pattern. |
地址 |
Yongin-City KR |