发明名称 SYSTEM AND METHODS FOR MEMORY INSTALLATION IN FUNCTIONAL TEST FIXTURE
摘要 A system and a method for testing information handling systems is provided. The system includes a top cover having a memory circuit and a bottom platform for receiving a test printed circuit board assembly (PCBA) including a slot. The system includes a sensor determining the relative position of the memory circuit and the slot; and a host controller coupled to the test PCBA and the sensor through a port. A computer program product including a non-transitory computer readable medium having computer readable and executable code is also provided. The code instructs a processor in a host controller in a test fixture to load a memory circuit on a crane; engage a sub-module carrying the memory circuit; load a printed circuit board assembly (PCBA); place a memory device on a slot in the PCBA; perform a system test on the PCBA; disengage the sub-module and the test fixture.
申请公布号 US2016025803(A1) 申请公布日期 2016.01.28
申请号 US201514877759 申请日期 2015.10.07
申请人 Jia Hui Peng;Yang Chunfeng;Li Bin 发明人 Jia Hui Peng;Yang Chunfeng;Li Bin
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项 1. A system comprising: a cover; a platform for receiving a first circuit assembly, the first circuit assembly including a slot; and a crane mounted to the cover, the crane being configured to move a second circuit assembly into the slot; wherein the crane compliantly aligns the second circuit assembly with the slot when moving the second circuit assembly into the slot.
地址 Shanghai CN