发明名称 ELECTRON SPIN DETECTOR, ANALYSIS DEVICE, AND ANALYSIS METHOD
摘要 Provided is a method capable of a highly efficient and simple data analysis of the degree of spin polarization for a secondary electron whereof the energy dispersion is on the order of 0 to 10 V, using a VLEED detector, which is a spin detector having a narrow energy acceptance. The method comprises using a magnetic field (304) whereby the to-be-measured electrons (301) are resolved by energy while being moved along a circle, and injected into a plurality of VLEED detectors (303) disposed on the circumference thereof. Since the angle of an electron spin (302) and the surface of each of the VLEED detectors (303) can be maintained constant while using the plurality of VLEED detectors (303), a detection of the degree of spin polarization, which allows for a highly efficient and simple data analysis, is possible.
申请公布号 WO2016013073(A1) 申请公布日期 2016.01.28
申请号 WO2014JP69466 申请日期 2014.07.23
申请人 HITACHI, LTD. 发明人 KOHASHI TERUO
分类号 H01J37/244 主分类号 H01J37/244
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