| 摘要 |
With a simple configuration, the time required for testing individually-disconnected test objects can be shortened by providing the following: a tray (10) having a plurality of retaining holes (11) that hold semiconductor packages (20) to be tested; a contact probe that is connected to the electrodes of the semiconductor packages (20); a probe-holder that holds the contact probe; and a position-determining means that is provided on the probe-holder and determines the position of the semiconductor packages (20) with respect to the retaining holes (11) when testing is carried out. |
