发明名称 INSPECTION METHOD FOR OPTICAL DISPLAY DEVICE AND PATTERN RECOGNITION METHOD FOR OPTICAL MEMBER
摘要 PROBLEM TO BE SOLVED: To provide an inspection method for an optical display device for achieving quality inspection with high reliability and to provide a pattern recognition method for an optical member, by which a boundary between a first region and a second region in a patterned retardation layer can be recognized with high accuracy.SOLUTION: The inspection method aims to inspect an optical device in which an optical member including a retardation layer is bonded to an optical display component having a plurality of pixel rows. A patterned retardation layer 3 has a plurality of strip-like first regions 3R and a plurality of strip-like second regions 3L, in which the plurality of first regions 3R and the plurality of second regions 3L are alternately arranged in a direction intersecting an extending direction of the first region 3R and the second region 3L. The method includes a measurement step of measuring a distance D in a plan view from a boundary line BL detected between the first region 3R and the second region 3L to a reference line FL set along pixel rows in a region between adjoining pixel rows; and a determination step of determining whether the optical display device is defective or not based on the distance D.
申请公布号 JP2016014714(A) 申请公布日期 2016.01.28
申请号 JP20140135741 申请日期 2014.07.01
申请人 SUMITOMO CHEMICAL CO LTD 发明人 CHEN TING HUAI;NISHIHARA NOBUHIKO;TANAKA HIROMITSU
分类号 G02F1/13363;G02B5/30;G02F1/13 主分类号 G02F1/13363
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