发明名称 |
INSPECTION METHOD FOR OPTICAL DISPLAY DEVICE AND PATTERN RECOGNITION METHOD FOR OPTICAL MEMBER |
摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method for an optical display device for achieving quality inspection with high reliability and to provide a pattern recognition method for an optical member, by which a boundary between a first region and a second region in a patterned retardation layer can be recognized with high accuracy.SOLUTION: The inspection method aims to inspect an optical device in which an optical member including a retardation layer is bonded to an optical display component having a plurality of pixel rows. A patterned retardation layer 3 has a plurality of strip-like first regions 3R and a plurality of strip-like second regions 3L, in which the plurality of first regions 3R and the plurality of second regions 3L are alternately arranged in a direction intersecting an extending direction of the first region 3R and the second region 3L. The method includes a measurement step of measuring a distance D in a plan view from a boundary line BL detected between the first region 3R and the second region 3L to a reference line FL set along pixel rows in a region between adjoining pixel rows; and a determination step of determining whether the optical display device is defective or not based on the distance D. |
申请公布号 |
JP2016014714(A) |
申请公布日期 |
2016.01.28 |
申请号 |
JP20140135741 |
申请日期 |
2014.07.01 |
申请人 |
SUMITOMO CHEMICAL CO LTD |
发明人 |
CHEN TING HUAI;NISHIHARA NOBUHIKO;TANAKA HIROMITSU |
分类号 |
G02F1/13363;G02B5/30;G02F1/13 |
主分类号 |
G02F1/13363 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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