| 发明名称 |
SCANNING PROBE MICROSCOPE HEAD DESIGN |
| 摘要 |
A SPM head incorporates a probe and a cantilever on which the probe is mounted. The cantilever has a planar reflecting surface proximate a free end of the cantilever. The cantilever extends from a mechanical mount and a single-mode optical fiber is supported by the mechanical mount to provide a beam axis at an angle away from normal relative to the reflecting surface. |
| 申请公布号 |
US2016025771(A1) |
申请公布日期 |
2016.01.28 |
| 申请号 |
US201514805679 |
申请日期 |
2015.07.22 |
| 申请人 |
Angstrom Science, Inc. |
发明人 |
Erickson Andrew Norman;Ippolito Stephen Bradley;Hofstatter Kyle Alfred |
| 分类号 |
G01Q20/02;G01Q60/38;G01Q60/24;G02B6/26;G02B6/255 |
主分类号 |
G01Q20/02 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A structure comprising:
a probe; a cantilever on which the probe is mounted, said cantilever having a planar reflecting surface proximate a free end of the cantilever; a mechanical mount from which the cantilever extends and, a single-mode optical fiber; said single-mode optical fiber supported by the mechanical mount to provide a beam axis at an angle away from normal relative to the reflecting surface. |
| 地址 |
Santa Barbara CA US |
