发明名称 |
MRAM Device and Fabrication Method Thereof |
摘要 |
A method of forming and a magnetoresistive random access memory (MRAM) device. In an embodiment, the MRAM device includes a magnetic tunnel junction (MTJ) disposed over a bottom electrode, the magnetic tunnel junction having a first sidewall, a top electrode disposed over the magnetic tunnel junction, and a dielectric spacer supported by the magnetic tunnel junction and extending along sidewalls of the top electrode, the dielectric spacer having a second sidewall substantially co-planar with the first sidewall of the magnetic tunnel junction. |
申请公布号 |
US2016028000(A1) |
申请公布日期 |
2016.01.28 |
申请号 |
US201514874149 |
申请日期 |
2015.10.02 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Tsai Chia-Shiung;Hsu Chern-Yow;Sung Fu-Ting;Liu Shih-Chang;Huang Wei-Hang |
分类号 |
H01L43/12 |
主分类号 |
H01L43/12 |
代理机构 |
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代理人 |
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主权项 |
1. A method for forming a magnetoresistive random access memory (MRAM) device, the method comprising:
forming a bottom electrode layer over a substrate; forming magnetic tunnel junction (MTJ) layers over the bottom electrode layer; forming a top electrode layer over the MTJ layers; patterning the top electrode layer, thereby forming a top electrode; forming first spacers along sidewalls of the top electrode; patterning the MTJ layers using the first spacers as a mask, thereby forming an MTJ stack; forming second spacers along sidewalls of the MTJ stack and the first spacers; and patterning the bottom electrode layer using the second spacers as a mask, thereby forming a bottom electrode. |
地址 |
Hsin-Chu TW |