发明名称 DATA CORRECTION METHOD IN FINE PARTICLE MEASURING DEVICE AND FINE PARTICLE MEASURING DEVICE
摘要 <p>To provide a technique capable of highly accurately measure the intensity and the spectrum of fluorescence and scattered light by effectively correcting measurement error that occurs due to variation of flow positions of fine particles in a channel. A data correction method for a fine particle measurement device is provided, which includes an intensity detection procedure capable of detecting light generated from a fine particle by emitting light onto the fine particle flowing through a channel, and obtaining intensity information about the light, a position detection procedure capable of obtaining position information about the fine particle, and a correction procedure for correct ing the intensity information on the basis of the position information. In this data correction method, the position detection procedure is such that a detection device receives light of an S polarization component which is separated from scattered light generated from the fine particle and given astigmatism, and a light reception position of the S polarization component on the detection device is obtained as the position information.</p>
申请公布号 EP2860511(A4) 申请公布日期 2016.01.27
申请号 EP20130800843 申请日期 2013.04.03
申请人 SONY CORPORATION 发明人 NITTA NAO;IMANISHI SHINGO;TAKEUCHI TAICHI
分类号 G01N15/14;G01N15/10;G01N21/05;G01N21/21;G01N21/49;G01N21/53;G01N21/64 主分类号 G01N15/14
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