发明名称 |
Techniques to determine concentration parameters of conductive liquid electrophoretic (LEP) inks |
摘要 |
Techniques to determine concentration parameters of conductive liquid electrophoretic (LEP) inks are illustrated herein. In an example, a layer of conductive LEP ink is formed on a developer roller using electrostatic forces acting on the conductive LEP ink. A current is generated in response to a voltage between a measurement electrode and a developer roller. The current flows through the conductive LEP ink layer. |
申请公布号 |
US9244390(B2) |
申请公布日期 |
2016.01.26 |
申请号 |
US201214391137 |
申请日期 |
2012.07.31 |
申请人 |
Hewlett-Packard Development Company, L.P. |
发明人 |
Lam Quang P;Chun Doris;Ng Hou T. |
分类号 |
G03G15/10;G03G15/08;G01N27/02;G03G21/00 |
主分类号 |
G03G15/10 |
代理机构 |
Hewlett-Packard Patent Department |
代理人 |
Hewlett-Packard Patent Department |
主权项 |
1. A method to measure a concentration parameter of a conductive liquid electrophoretic (LEP) ink, the method comprising:
forming a layer of the conductive LEP ink on a developer roller using electrostatic forces acting on the conductive LEP ink; determining an electrical parameter related to a current generated in response to a voltage between a measurement electrode and the developer roller wherein the measurement electrode is comprised in a squeegee roller or a cleaning roller and wherein the measurement electrode cooperates with the developer roller in a binary ink developer, the current flowing through the conductive LEP ink layer, the current magnitude being co-related with the concentration of the conductive LEP ink; and associating the determined electrical parameter with the concentration parameter of the conductive LEP ink. |
地址 |
Houston TX US |