发明名称 Sample analyzing system, sample analyzer, and management method of sample analyzing system
摘要 A sample analyzing system comprising: a first sample analyzer including a first measurement unit for measuring a sample and a first control unit for controlling the first measurement unit; and a second sample analyzer including a second measurement unit for measuring the sample and a second control unit for controlling the second measurement unit; wherein the first control unit is configured to transmit an activation signal for activating the second sample analyzer when a predetermined condition is met for the first sample analyzer; and the second control unit is configured to activate the second sample analyzer when the activation signal is received.
申请公布号 US9244086(B2) 申请公布日期 2016.01.26
申请号 US201313851677 申请日期 2013.03.27
申请人 SYSMEX CORPORATION 发明人 Yao Syunsuke;Kuwaoka Shiro;Nishida Taisuke
分类号 G01N21/00;G01N35/00;G01N33/00 主分类号 G01N21/00
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A sample analyzing system comprising: a first sample analyzer including a first measurement unit for measuring a sample, a first control unit for controlling the first measurement unit, and a storage unit for storing sample identification information for identifying the sample on which measurement is requested and order information including item information indicating an item on which the measurement is requested; and a second sample analyzer including a second measurement unit for measuring the sample and a second control unit for controlling the second measurement unit; wherein the first control unit is configured to transmit an activation signal for activating the second sample analyzer when a predetermined condition is met for the first sample analyzer and transmit setting information related to operation of the first sample analyzer after transmitting the activation signal; the second control unit is configured to activate the second sample analyzer when the activation signal is received, execute setting processing for performing operation setting of the second sample analyzer based on the setting information when the setting information is received and register the order information of the second sample analyzer based on the order information contained in the received setting information when the setting information is received; and the setting information includes the order information stored in the storage unit.
地址 Hyogo JP