| 发明名称 |
Controlling charged particles with inhomogeneous electrostatic fields |
| 摘要 |
An energy analyzer for a charged-particle spectrometer may include a top deflection plate and a bottom deflection plate. The top and bottom deflection plates may be non-symmetric and configured to generate an inhomogeneous electrostatic field when a voltage is applied to one of the top or bottom deflection plates. In some instances, the top and bottom deflection plates may be L-shaped deflection plates. |
| 申请公布号 |
US9245726(B1) |
申请公布日期 |
2016.01.26 |
| 申请号 |
US201414497247 |
申请日期 |
2014.09.25 |
| 申请人 |
The United States of America as represented by the Administrator of the National Aeronautics and Space Administration |
发明人 |
Herrero Federico A. |
| 分类号 |
H01J49/22;H01J49/26;H01J49/28;H01J49/48;H01J47/00;H01J40/04 |
主分类号 |
H01J49/22 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An energy analyzer comprising:
a first deflection plate; and a second deflection plate, wherein the first deflection plate and the second deflection plate are not symmetric, and wherein the first deflection plate and the second deflection plate generate an inhomogeneous electrostatic field between the first deflection plate and the second deflection plate when a voltage is applied to one of the first deflection plate or the second deflection plate. |
| 地址 |
Washington DC US |
