发明名称 |
Structure and method for semiconductor device |
摘要 |
A semiconductor device and a method of forming the same are disclosed. The semiconductor device includes a substrate, and a source region and a drain region formed in the substrate. The semiconductor device further includes an impurity diffusion stop layer formed in a recess of the substrate between the source region and the drain region, wherein the impurity diffusion stop layer covers bottom and sidewalls of the recess. The semiconductor device further includes a channel layer formed over the impurity diffusion stop layer and in the recess, and a gate stack formed over the channel layer. The impurity diffusion stop layer substantially prevents impurities of the substrate and the source and drain regions from diffusing into the channel layer. |
申请公布号 |
US9246002(B2) |
申请公布日期 |
2016.01.26 |
申请号 |
US201414208294 |
申请日期 |
2014.03.13 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Hsiao Ru-Shang;Wang Ling-Sung;Huang Chih-Mu;Chao Chih-Kang;Chiang Chen-Chieh |
分类号 |
H01L21/338;H01L29/78;H01L29/66;H01L29/10 |
主分类号 |
H01L21/338 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method of forming a semiconductor device, comprising:
etching a substrate thereby forming a recess in the substrate; forming an impurity diffusion stop layer in the recess, the impurity diffusion stop layer covering a bottom and sidewalls of the recess; forming a channel layer over the impurity diffusion stop layer; and forming a gate stack over the channel layer. |
地址 |
Hsin-Chu TW |