发明名称 |
Two axis encoder head assembly |
摘要 |
A measurement system for measuring the position of a work piece (28) includes a stage grating (234) and an encoder head (236). A first measurement beam (38A) is directed at the stage grating (234) at a first angle, the first measurement beam (38A) being at a first wavelength. A second measurement beam (38B) is directed at the stage grating (234) at a second angle that is different than the first angle, the second measurement beam (38B) being at a second wavelength that is different than the first wavelength. At least a portion of the first measurement beam (38A) and at least a portion of the second measurement beam (38B) are interfered with one another to create a measurement signal along a signal axis. |
申请公布号 |
US9243896(B2) |
申请公布日期 |
2016.01.26 |
申请号 |
US201313796316 |
申请日期 |
2013.03.12 |
申请人 |
Nikon Corporation |
发明人 |
Goodwin Eric Peter |
分类号 |
G03B27/54;G03B27/52;G01B11/14;G03F7/20 |
主分类号 |
G03B27/54 |
代理机构 |
Roeder & Broder LLP |
代理人 |
Roeder & Broder LLP ;Roeder Steven G. |
主权项 |
1. A measurement system for measuring relative movement between a first member and a second member, the measurement system comprising:
a grating that is coupled to one of the first member and the second member; and an encoder head that is coupled to the other of the first member and the second member; wherein the encoder head directs a first measurement beam at the grating at a first angle, the first measurement beam being at a first wavelength, and directs a second measurement beam at the grating at a second angle that is different than the first angle, the second measurement beam being at a second wavelength that is different than the first wavelength; and wherein at least a portion of the first measurement beam that is diffracted at least twice by the grating and at least a portion of the second measurement beam that is diffracted at least twice by the grating are interfered with one another to create a measurement signal along a signal axis. |
地址 |
JP |