| 摘要 |
The present invention relates to a secondary cell penetrometer. The technical grounds of the present invention lies in a secondary cell penetrometer which is utilized for the development of new products and the manufacturing process by the usage of data obtained by a penetration pin which penetrates cells from a confirmation or detection of the explosion of cells, and a change of current and temperature change of the cells. At the time of such penetration test, by determining a depth of penetration as to whether cells are completely penetrated, a penetration section (location) of a penetration pin is formed to be controlled at high speeds such that a precision test is possible. A data cable connected to the penetration pin is formed to easily collect the above-identified change value data. At the time of performing a test, as to the danger of explosion in a chamber, the safety is widely secured by a separate shock damper. A jig to fixate cells is formed to easily adjust the penetration location by a transport device. More specifically, at the time of an upward return of the penetration pin after performing the test, a compulsive support is configured not to go up, along with the penetration pin of cells such that after penetration, an electrolyte running down from the cells runs down the jig to prevent corrosion of the internal chamber. As such, durability of a device and the environment of a continuous test in a chamber are greatly improved. |
