发明名称 Semiconductor devices and fabrication methods
摘要 Methods of fabricating vertical devices are described, along with apparatuses and systems that include them. In one such method, a vertical device is formed at least partially in a void in a first dielectric material and a second dielectric material. Additional embodiments are also described.
申请公布号 US9245987(B2) 申请公布日期 2016.01.26
申请号 US201213689442 申请日期 2012.11.29
申请人 Micron Technology, Inc. 发明人 Mariani Marcello;Pozzi Carlo
分类号 H01L29/74;H01L29/66 主分类号 H01L29/74
代理机构 Schwegman Lundberg & Woessner, P.A. 代理人 Schwegman Lundberg & Woessner, P.A.
主权项 1. A method comprising: forming a first dielectric material on a substrate; removing a portion of the first dielectric material to leave a remainder of the first dielectric material on the substrate; forming a second dielectric material on the substrate in contact with the remainder of the first dielectric material; removing a portion of the second dielectric material to leave a remainder of the second dielectric material in contact with the remainder of the first dielectric material; forming a vertical semiconductor structure in contact with the remainder of the first dielectric material and the remainder of the second dielectric material; forming a gate dielectric material on the remainder of the second dielectric material, a side of the vertical semiconductor structure, and a side of the remainder of the first dielectric material; forming a vertical gate material on a first portion of the gate dielectric material formed on the side of the vertical semiconductor structure and on the ate dielectric material formed on the remainder of the second dielectric material; and forming a third dielectric material on a second portion of the gate dielectric material on the side of the vertical semiconductor structure.
地址 Boise ID US