发明名称 Actinic ray-sensitive or radiation-sensitive resin composition, and, resist film, pattern forming method, electronic device manufacturing method, and electronic device, each using the same
摘要 An actinic ray-sensitive or radiation-sensitive resin composition of the present invention includes a resin (P) having a repeating unit (a) represented by following General Formula (I), a compound (B) generating organic acid by irradiation of actinic ray or radiation, and 1% by mass or more of a resin (C) which has at least one of a fluorine atom and a silicon atom and is different from the resin (P) with regard to total solids of the actinic ray-sensitive or radiation-sensitive resin composition,; wherein, in General Formula (I), R0 represents a hydrogen atom or a methyl group, and each of R1, R2, and R3 independently represents a straight chain or branched alkyl group.
申请公布号 US9244344(B2) 申请公布日期 2016.01.26
申请号 US201213614872 申请日期 2012.09.13
申请人 FUJIFILM Corporation 发明人 Koshijima Kosuke;Takahashi Hidenori;Yamaguchi Shuhei;Yamamoto Kei
分类号 G03F7/038;G03F7/004;G03F7/039;G03F7/11;G03F7/20;G03F7/32 主分类号 G03F7/038
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. An actinic ray-sensitive or radiation-sensitive resin composition comprising: a resin (P) having a repeating unit (a) represented by a following General Formula (I), a compound (B) generating organic acid by irradiation of actinic ray or radiation, and 1% by mass or more of a resin (C) which has at least one of a fluorine atom and a silicon atom and is different from the resin (P) with regard to total solids of the actinic ray-sensitive or radiation-sensitive resin composition, wherein the resin (P) is a resin containing 45 mol % or more of the repeating unit (a) with regard to all repeating units in the resin (P); in Formula (I), R0 represents a hydrogen atom or a methyl group, and each of R1, R2, and R3 independently represents a straight chain or branched alkyl group.
地址 Tokyo JP