发明名称 SUBSTRATE PROCESSING SYSTEM
摘要 The present invention provides a substrate providing system. The system includes: a first chamber including a gate; a second chamber including a gate, and connected to the first chamber; a sensor part including a sensor sensing a substrate on a transfer route of the substrate; a calculating part calculating a substrate sensing time by using substrate sensing start and termination information, inputted from the sensor part in a process of transferring the substrate, and comparing the calculated substrate sensing time to a standard time when the sensor part senses a normal substrate in a process of transferring the normal substrate, and therefore, determining whether the substrate is normal or abnormal; and a transfer part transferring the substrate between the first chamber and the second chamber.
申请公布号 KR20160009315(A) 申请公布日期 2016.01.26
申请号 KR20140089656 申请日期 2014.07.16
申请人 WONIK IPS CO., LTD. 发明人 NOH, IL HO;BANG, SEUNG DUK;KIM, BEOM JUN
分类号 H01L21/66;H01L21/02;H01L21/677 主分类号 H01L21/66
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