发明名称 Semiconductor device and method of simultaneous molding and thermalcompression bonding
摘要 A semiconductor device has a semiconductor die disposed over a substrate. The semiconductor die and substrate are placed in a chase mold. An encapsulant is deposited over and between the semiconductor die and substrate simultaneous with bonding the semiconductor die to the substrate in the chase mold. The semiconductor die is bonded to the substrate using thermocompression by application of force and elevated temperature. An electrical interconnect structure, such as a bump, pillar bump, or stud bump, is formed over the semiconductor die. A flux material is deposited over the interconnect structure. A solder paste or SOP is deposited over a conductive layer of the substrate. The flux material and SOP provide temporary bond between the semiconductor die and substrate. The interconnect structure is bonded to the SOP. Alternatively, the interconnect structure can be bonded directly to the conductive layer of the substrate, with or without the flux material.
申请公布号 US9245770(B2) 申请公布日期 2016.01.26
申请号 US201314038339 申请日期 2013.09.26
申请人 STATS ChipPAC, Ltd. 发明人 Kim KyungMoon;Lee KooHong;Yee JaeHak;Kim YoungChul;Hoang Lan;Marimuthu Pandi C.;Anderson Steve;Chi HeeJo
分类号 H01L23/48;H01L23/52;H01L29/40;H01L21/56;H01L23/00;H01L23/31;H01L23/498 主分类号 H01L23/48
代理机构 Patent Law Group: Atkins and Associates, P.C. 代理人 Atkins Robert D.;Patent Law Group: Atkins and Associates, P.C.
主权项 1. A method of making a semiconductor device, comprising: providing a substrate; disposing a semiconductor die over the substrate; forming an interconnect structure over the semiconductor die; and simultaneously depositing an encapsulant around the semiconductor die and over the substrate and reflowing the interconnect structure.
地址 Singapore SG