Amperage/voltage loop calibrator with loop diagnostics

摘要

A testing device determines values of various electrical variables associated with a device within a process system. The testing device provides bi-directional electrical communication with a device to be monitored and automatically provides a connection configuration between a processing unit and a set of input/output ports. The processing unit outputs a test signal and a configuration control signal to the input/output port control circuitry. The input/output port control circuitry provides a connection configuration to direct the test signal to the device to be monitored and directs a return signal from the monitored device to the processing unit. The processing unit measures an electrical characteristic of the return signal and determines at least two electrical variables associated with the monitored device based upon the measured electrical characteristic of the return signal.

主权项

1. A testing device for providing diagnostics of a device under test, comprising:
a processing unit; said processing unit including a processor, a digital-to-analog converter, and an analog-to digital converter; a plurality of ports to provide an electrical communication interface for said processing unit; said plurality of ports including,
a first port to provide an electrical communication interface for said processing unit,a second port to provide an electrical communication interface for said processing unit,a third port to provide an electrical communication interface for said processing unit, anda fourth port to provide an electrical communication interface for said processing unit; a set of wires, each wire being connected to a port of said plurality of ports and to the device under test; and port control circuitry operatively connected to said plurality of ports, said processor, said digital-to-analog converter, and said analog-to-digital converter; said processor outputting digital test signals to said digital-to-analog converter and configuration control signals to said port control circuitry; said port control circuitry, in response to the received configuration control signals, configuring a connection scheme between said processing unit and said plurality of ports to provide test paths for test signals to be transmitted from said digital-to-analog converter to the device under test; said port control circuitry, in response to the received configuration control signals, configuring the connection scheme between said processing unit and said plurality of ports to provide return paths for return signals from the device under test to said analog-to-digital converter, said return signals corresponding to the test signals transmitted from said digital-to-analog converter to the device under test, said return paths enabling said processing unit to measure the return signals, corresponding to the test signals transmitted from said digital-to-analog converter to the device under test; said processing unit measuring said return signals; said processing unit, based upon the connection scheme of said port control circuitry and the measured return signals, determining if two wires are connected to said plurality of ports; said processing unit, based upon the connection scheme of said port control circuitry and the measured return signals, determining if three wires are connected to said plurality of ports; said processing unit, based upon the connection scheme of said port control circuitry and the measured return signals, determining if four wires are connected to said plurality of ports.