| 发明名称 |
Measuring Resistor and Method for Producing a Measuring Resistor |
| 摘要 |
A measuring resistor for high-current measurements is provided, which has a defined resistance value. The measuring resistor has a resistive layer having a sheet resistivity. The resistance value of the measuring resistor is defined by the resistive layer and is less than the sheet resistivity of the resistive layer. |
| 申请公布号 |
US2016020004(A1) |
申请公布日期 |
2016.01.21 |
| 申请号 |
US201514800048 |
申请日期 |
2015.07.15 |
| 申请人 |
Infineon Technologies Austria AG |
发明人 |
Kampl Severin;Kirchner Uwe |
| 分类号 |
H01C7/00;H01C17/06;G01R19/00 |
主分类号 |
H01C7/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A measuring resistor for high-current measurements, which has a defined resistance value, comprising:
a resistive layer having a sheet resistivity, wherein the resistance value of the measuring resistor is defined by the resistive layer and is less than the sheet resistivity of the resistive layer. |
| 地址 |
Villach AT |
