| 摘要 |
A system for detecting the profile of an object. The system having a radiation source for generating a radiation pattern. The system also having a detector which has a plurality of pixels and a processor for processing data from the detector when radiation from the radiation source is reflected by an object and detected by the detector. The system also has a synchronization device for interfacing between the detector and the radiation source. The radiation source is designed for operating in pulsed mode and the synchronization device can synchronize the pulses of the radiation source with the sampling of the detector. |
