发明名称 CONCENTRATION QUANTIFICATION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a concentration quantification apparatus, a concentration quantification method, and a program capable of noninvasively and accurately quantifying the concentration of target components in an arbitrary layer by accurately measuring and ensuring a close contact state between an irradiation unit and an observation object.SOLUTION: A concentration quantification apparatus 100 according to the present invention comprises: an irradiation part 106; a light reception part 107; an optical path length distribution storage part 103; an optical path length acquisition part 108; a time resolution waveform storage part 105; a close contact determination part 111 for determining whether or not the irradiation part 106 and an observation object is in a close contact state; a measurement light intensity acquisition part 113 for, when the close contact determination part 111 determined that the irradiation part 106 and the observation object is in a close contact state, acquiring the intensity of the light received by the light reception part 107; a light absorption coefficient calculation part 117 for calculating the light absorption coefficient of target components of an arbitrary layer; and a concentration calculation part 120 for calculating the concentration of the target components of the arbitrary layer on the basis of the light absorption coefficient acquired by the light absorption coefficient calculation part 117.
申请公布号 JP2016010717(A) 申请公布日期 2016.01.21
申请号 JP20150175942 申请日期 2015.09.07
申请人 SEIKO EPSON CORP 发明人 AMANO KAZUHIKO;SHIMIZU KOICHI
分类号 A61B5/1455;G01N21/17 主分类号 A61B5/1455
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