发明名称 ABNORMALITY DETECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To automatically extract the data related to abnormally from extensive accumulation data, and to share analysis information (abnormal analysis result).SOLUTION: An abnormality detection system which detects abnormality of a plurality of apparatuses includes: data accumulation means to accumulate output data of the plurality of apparatuses; and an indicator to display the accumulated output data. The indicator displays time series of an index value obtained by indexing the output data. When abnormalities are detected in either one of the plurality of apparatuses, the indicator displays the index value in the vicinity of the time in which the abnormality is detected in accordance with a predetermined rule.
申请公布号 JP2016012240(A) 申请公布日期 2016.01.21
申请号 JP20140133510 申请日期 2014.06.30
申请人 HITACHI LTD 发明人 IIBOSHI YOICHI;FURUYA SATORU
分类号 G05B23/02 主分类号 G05B23/02
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