发明名称 MAGNETIC TUNNEL JUNCTION DEVICE
摘要 The output voltage of an MRAM is increased by means of an Fe(001)/MgO(001)/Fe(001) MTJ device, which is formed by microfabrication of a sample prepared as follows: A single-crystalline MgO (001) substrate is prepared. An epitaxial Fe(001) lower electrode (a first electrode) is grown on a MgO(001) seed layer at room temperature, followed by annealing under ultrahigh vacuum. A MgO(001) barrier layer is epitaxially formed on the Fe(001) lower electrode (the first electrode) at room temperature, using a MgO electron-beam evaporation. A Fe(001) upper electrode (a second electrode) is then formed on the MgO(001) barrier layer at room temperature. This is successively followed by the deposition of a Co layer on the Fe(001) upper electrode (the second electrode). The Co layer is provided so as to increase the coercive force of the upper electrode in order to realize an antiparallel magnetization alignment.
申请公布号 US2016020385(A1) 申请公布日期 2016.01.21
申请号 US201514837558 申请日期 2015.08.27
申请人 Japan Science and Technology Agency ;National Institute of Advanced Industrial Science and Technology 发明人 YUASA Shinji
分类号 H01L43/10;H01L43/02 主分类号 H01L43/10
代理机构 代理人
主权项 1. A tunnel barrier layer disposed on a ferromagnetic material layer that is disposed on a substrate, wherein the tunnel barrier layer comprises a poly-crystalline magnesium oxide layer in which a (001) crystal plane is preferentially oriented, and wherein the ferromagnetic material layer is composed of an Fe—Co alloy of BCC which alloy comprises Fe, Co, and B.
地址 Kawaguchi-shi JP