发明名称 IMAGING DEVICE, INSPECTION APPARATUS, AND METHOD OF MANUFACTURING ELECTRONIC DEVICE
摘要 The imaging device includes a sensor substrate, a light-blocking substrate, a light-collecting substrate, a sealing material, and a light-transmitting member. The light-transmitting member includes a light-transmitting base disposed to be in contact with either the sensor substrate or the light-blocking substrate, and a light-transmitting resin which is filled between the base and the sensor substrate or the light-blocking substrate. A void is formed in at least a part of a space between the sealing material and the light-transmitting member.
申请公布号 US2016020245(A1) 申请公布日期 2016.01.21
申请号 US201514867736 申请日期 2015.09.28
申请人 SEIKO EPSON CORPORATION 发明人 FUKAGAWA Takefumi;MIYATA Takashi;HIGUCHI Satoshi;OKAMOTO Tatsuya
分类号 H01L27/146;G01J1/04;G01J1/42 主分类号 H01L27/146
代理机构 代理人
主权项 1. A method of manufacturing an electronic device having a pair of substrates disposed to be opposite to each other at a predetermined gap, the method comprising: forming a base on one substrate of the pair of substrates; coating the periphery of the base with an adhesive including a gap material forming the predetermined gap; coating the surface of the base with a light transmitting resin material; disposing the pair of substrates at a predetermined gap by bringing the other substrate of the pair of substrates in contact with the light transmitting resin material to be superposed on the one substrate; and solidifying the adhesive.
地址 Tokyo JP