STORAGE SYSTEM MANAGING RUN-TIME BAD CELLS

摘要

A storage system according to the embodiment of the present invention includes a storage device which includes a nonvolatile memory and a device memory and requires a test for the device memory; and a host which receives a memory test request from the storage device, executes a test for the device memory, and stores a test result in the nonvolatile memory. According to the present invention, because a memory is tested according to the memory test request of the storage device, a run-time bad cell generated in using products can be fined out and managed without the deterioration of a storage system.