| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC socket enabling an electrical characteristic test even when an IC device is inserted to the IC socket in an arbitrary direction.SOLUTION: An IC socket includes an IC pocket 203 for housing an IC device 100 in a housing 201 and a top cover 202, where a plurality of probes a1 to a4, and b1 to b4 is disposed in the IC pocket 203. The probes are separated into undersurface probes a1 to a4 and top face probes b1 to b4, and the corresponding undersurface probes and the top face probes are electrically connected to each other by a conductor 204. |
