发明名称 |
SOLID-STATE IMAGING DEVICE, METHOD OF MANUFACTURING THE SAME, AND ELECTRONIC APPARATUS |
摘要 |
Solid-state imaging devices, methods of producing a solid-state imaging device, and electronic apparatuses are provided. More particularly, a solid-state image device (1) includes a silicon substrate (22), and at least a first photodiode (33) formed in the silicon substrate. The device also includes an epitaxial layer (21) with a first surface adjacent a surface of the silicon substrate, and a transfer transistor (31) with a gate electrode (41) that extends from the at least a first photodiode to a second surface of the epitaxial layer opposite the first surface. In further embodiments, a solid-state imaging device with a plurality of pixels formed in a second semiconductor substrate wherein the pixels are symmetrical with respect to a center point is provided. A floating diffusion is formed in an epitaxial layer, and a plurality of transfer gate electrodes that are each electrically connected to the floating diffusion by one of the transfer gate electrodes is provided. |
申请公布号 |
US2016020236(A1) |
申请公布日期 |
2016.01.21 |
申请号 |
US201414772196 |
申请日期 |
2014.03.03 |
申请人 |
SONY CORPORATION |
发明人 |
TANAKA Yosuke;WAKANO Toshifumi;TATANI Keiji;NAGANO Takashi;IWAMOTO Hayato;NAKAZAWA Keiichi;HIRANO Tomoyuki;YAMAGUCHI Shinpei;MARUYAMA Shunsuke |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A solid-state imaging device, comprising:
a silicon substrate; at least a first photodiode, wherein the first photodiode is formed in the silicon substrate; an epitaxial layer, wherein a first surface of the epitaxial layer is adjacent a surface of the silicon substrate; a transfer transistor, wherein a gate electrode of the transfer transistor extends from the at least a first photodiode to a second surface of the epitaxial layer opposite the first surface. |
地址 |
Minato-ku, Tokyo JP |