发明名称 STACKED SEMICONDUCTOR DIE ASSEMBLIES WITH HIGH EFFICIENCY THERMAL PATHS AND ASSOCIATED SYSTEMS
摘要 Semiconductor die assemblies having high efficiency thermal paths. In one embodiment, a semiconductor die assembly comprises a package support substrate, a first semiconductor die electrically mounted to the package support substrate, and a plurality of second semiconductor dies. The first die has a stacking site and a peripheral region extending laterally from the stacking site, and the bottom second semiconductor die is attached to the stacking site of the first die. The assembly further includes (a) a thermal transfer structure attached to the peripheral region of the first die that has a cavity in which the second dies are positioned and an inlet, and (b) an underfill material in the cavity. The underfill material has a fillet between the second semiconductor dies caused by injecting the underfill material into the cavity through the inlet port of the casing.
申请公布号 WO2016010703(A1) 申请公布日期 2016.01.21
申请号 WO2015US37630 申请日期 2015.06.25
申请人 MICRON TECHNOLOGY, INC. 发明人 VADHAVKAR, SAMEER, S.;LI, XIAO;GANDHI, JASPREET, S.
分类号 H01L25/065;H01L23/28;H01L23/48 主分类号 H01L25/065
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