发明名称 |
CURRENT-PERPENDICULAR-TO-PLANE MAGNETO-RESISTANCE EFFECT ELEMENT |
摘要 |
The CPPGMR element of the present invention has an orientation layer 12 formed on a substrate 11 to texture a Heusler alloy into a (100) direction, an underlying layer 13 that is an electrode for magneto-resistance measurement stacked on the orientation layer 12, a lower ferromagnetic layer 14 and an upper ferromagnetic layer 16 each stacked on the underlying layer 13 and made of a Heusler alloy, a spacer layer 15 sandwiched between the lower ferromagnetic layers 14 and the upper ferromagnetic layers 16, and a cap layer 17 stacked on the upper ferromagnetic layer 16 for surface-protection. This manner makes it possible to provide, inexpensively, an element using a current-perpendicular-to-plane giant magneto-resistance effect (CPPGMR) of a thin film having a trilayered structure of a ferromagnetic metal/a nonmagnetic metal/a ferromagnetic metal, thereby showing excellent performances. |
申请公布号 |
US2016019917(A1) |
申请公布日期 |
2016.01.21 |
申请号 |
US201414774987 |
申请日期 |
2014.04.02 |
申请人 |
NATIONAL INSTITUTE FOR MATERIALS SCIENCE |
发明人 |
DU Ye;FURUBAYASHI Takao;TAKAHASHI Yukiko;HONO Kazuhiro |
分类号 |
G11B5/39;G11B5/127;G11B5/09 |
主分类号 |
G11B5/39 |
代理机构 |
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代理人 |
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主权项 |
1. A current-perpendicular-to-plane magneto-resistance effect element, comprising:
a substrate comprising at least one of a surface-oxidized Si substrate, a silicon substrate, a glass substrate, and a metal substrate; an orientation layer formed on the substrate to texture Heusler alloy into a (100) direction; a lower ferromagnetic layer and an upper ferromagnetic layer that each comprises a polycrystalline thin film of a Heusler alloy textured into a (100) direction, and that are each formed on the orientation layer; and a spacer layer sandwiched between the lower ferromagnetic layer and the upper ferromagnetic layer. |
地址 |
Tsukuba-shi, Ibaraki JP |