发明名称 SEMICONDUCTOR DEVICE
摘要 This semiconductor device includes a drift layer (11), a base layer (12) formed on the drift layer, a collector layer (21) and a cathode layer (22) disposed opposing the base layer, a plurality of trenches (13) penetrating the base layer, gate electrodes (17a, 17b) formed in the respective trenches, an emitter region (14) formed in a surface part of the base layer in such a manner as to contact each trench, a first electrode (19) connected to the base layer and the emitter region, and a second electrode (23) connected to the collector layer and the cathode layer. The gate electrode (17b) in a diode region of the semiconductor substrate can be controlled in a different way from that of the gate electrode (17a) in an IGBT region, and a voltage is applied to the gate electrode (17b) so as not to form an inversion layer (24) in the base layer.
申请公布号 WO2016009616(A1) 申请公布日期 2016.01.21
申请号 WO2015JP03420 申请日期 2015.07.07
申请人 DENSO CORPORATION 发明人 SUMITOMO, MASAKIYO;TAKAHASHI, SHIGEKI
分类号 H01L29/739;H01L27/04;H01L29/78;H01L29/861;H01L29/868 主分类号 H01L29/739
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