发明名称 CONTACT PROBE AND CONTACT PROBE UNIT
摘要 PROBLEM TO BE SOLVED: To provide a contact probe and a contact probe unit which are capable of reducing time and cost taken in drilling processing of a guide plate, and simplifying an assembly work of the contact probe to an inspection unit.SOLUTION: The problem is solved by a contact probe 1A that measures electric characteristics by allowing a tip 2a to contact a body to be measured 51, which has: a pin-shaped probe body 4 having a body part A and both end parts; and an exterior member 5 provided for an outer periphery of a rear end part 4b out of both end parts of the probe body 4. An electrode terminal 6 electrically connected to the probe body 4 may be provided for an end surface 5b of a rear end side of the exterior member 5, and an electric wire may be electrically connected to an end surface 2b of the rear end side of the probe body 4. Further, it is preferable that a cross-sectional shape of the exterior member 5 be a polygonal shape.
申请公布号 JP2016011925(A) 申请公布日期 2016.01.21
申请号 JP20140134676 申请日期 2014.06.30
申请人 TOTOKU ELECTRIC CO LTD 发明人 KOAIZAWA HISASHI;MINASE TOMIO
分类号 G01R1/067;G01R31/26;H01L21/66 主分类号 G01R1/067
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