| 发明名称 |
APPARATUS AND METHOD FOR SUPPORTING COMPUTER AIDED DIAGNOSIS (CAD) BASED ON PROBE SPEED |
| 摘要 |
There is provided an apparatus for supporting Computer Aided Diagnosis (CAD) based on a speed of a probe. The apparatus includes a region of interest (ROI) detector configured to detect an ROI from a current image acquired from a probe; and an ROI classifier configured to determine whether to classify the ROI using a determined state of a speed, and classify the ROI according to a result of the determination. |
| 申请公布号 |
US2016019441(A1) |
申请公布日期 |
2016.01.21 |
| 申请号 |
US201514795027 |
申请日期 |
2015.07.09 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
RYU Seung Woo;SEONG Yeong Kyeong;WOO Kyoung Gu |
| 分类号 |
G06K9/62;G06T7/00;G06K9/46;A61B8/08 |
主分类号 |
G06K9/62 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An apparatus to support Computer Aided Diagnosis (CAD), comprising:
a region of interest (ROI) detector configured to detect an ROI from a current image acquired from a probe; and an ROI classifier configured to determine whether to classify the ROI using a determined state of the speed, and to classify the ROI according to a result of the determination. |
| 地址 |
Suwon-si KR |
