发明名称 Interposer Defect Coverage Metric and Method to Maximize the Same
摘要 A method includes receiving a design of an interposer having nets, probe pads, and micro-bumps. The nets connect the micro-bumps. The probe pads are initially unconnected to the nets. The method further includes initializing a first set to logically include the nets; processing the first set such that every net interconnecting more than two micro-bumps is divided into a plurality of nets and every two micro-bumps are interconnected by one net; calculating an untested length for each net in the first set; selecting a net N from the first set wherein the net N has the maximum untested length in the first set, the net N representing at least a portion of a net P of the nets; selecting a pair of probe pads that are unconnected to the nets; and connecting the pair of probe pads to the net P by two dummy nets.
申请公布号 US2016019332(A1) 申请公布日期 2016.01.21
申请号 US201514868525 申请日期 2015.09.29
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Goel Sandeep Kumar;Mehta Ashok
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method, comprising the steps of: receiving a design of an interposer for a three-dimensional integrated circuit, the interposer having nets, probe pads, and micro-bumps, each of the nets connecting at least one of the micro-bumps, the probe pads initially unconnected to the nets; initializing a first set to logically include the nets; processing the first set such that every net interconnecting more than two micro-bumps is divided into a plurality of nets and every two of the more than two micro-bumps are interconnected by one of the plurality of nets; calculating an untested length for each net in the first set; selecting a net N from the first set wherein the net N has the maximum untested length among all nets in the first set, the net N representing at least a portion of a net P of the nets; selecting a pair of probe pads from the probe pads that are unconnected to the nets; and connecting the pair of probe pads to the net P by two dummy nets, wherein at least one of: the initializing of the first set, the processing of the first set, the calculating of the untested length, the selecting of the net N, the selecting of the pair of probe pads, and the connecting of the pair of probe pads is performed by a computing system.
地址 Hsin-Chu TW