发明名称 TEMPERATURE-PROGRAMMED DESORPTION ANALYZER, SAMPLE TABLE USED FOR THE SAME, AND TEMPERATURE-PROGRAMMED DESORPTION ANALYTIC METHOD
摘要 PROBLEM TO BE SOLVED: To provide a temperature-programmed desorption analyzer in which, when performing a temperature-programmed desorption analysis of a material containing a subliming metal and low molecular weight gas, sensitivity of a detector does not decrease, quantitative analysis of the gas content and identification of a trap site of the gas is possible, a sample table and an analytic method.SOLUTION: A temperature-programmed desorption analyzer comprises: a vacuum chamber; a detector; a sample stage; a heater; and a sample table consisting of a pair of a box and a lid in which a gold thin film is contained inside of the lid, or a temperature-programmed desorption analyzer comprises: a vacuum chamber; a detector; a filter installed in front of the detector, which includes a metal plate where a gold thin film is contained; a sample stage; a heater; and a sample table consisting of a box. A temperature-programmed desorption analytic method analyzing content of low molecular weight gas and a trap site comprises the steps of: detecting ionic strength of the low molecular weight gas desorbed from a material containing a subliming metal and the low molecular weight gas by use of the temperature-programmed desorption analyzer; and trapping subliming metallic vapor by the gold thin film and obtaining subliming desorption spectrum of the low molecular weight gas at the same time.
申请公布号 JP2016011842(A) 申请公布日期 2016.01.21
申请号 JP20140132229 申请日期 2014.06.27
申请人 SUMIKA CHEMICAL ANALYSIS SERVICE LTD 发明人 OKUMA RYUJI
分类号 G01N25/14 主分类号 G01N25/14
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