CHIP CROSS-SECTION IDENTIFICATION AND RENDERING ANALYSIS

摘要

A defective integrated circuit (IC) is analyzed to identify a portion of the integrated circuit possibly containing an electrical defect. A computer is used to process the design information of the integrated circuit and to navigate to the physical portion of the integrated circuit where the potential electrical defect might be found. The design information includes information on the layout and the technology used to fabricate the integrated circuit. A three-dimensional view of the portion of the design of the integrated circuit where the electrical defect might be found is rendered, based on the design information for the integrated circuit.

主权项

1. A computer-implemented method for circuit analysis comprising:
identifying a portion of a semiconductor chip based on a layout for a design for the semiconductor chip; generating virtual cuts for a cross section of the layout; and rendering, using one or more processors, a three-dimensional view of the portion that was identified using the virtual cuts that were generated.