发明名称 MEASURING APPARATUS AND MEASURING METHOD
摘要 A measuring apparatus (1) includes a measuring circuit (4) that is an example of a physical amount transformer configured to measure an output current of a CT (2) and a power supply circuit (6) configured to input an output of the measuring circuit. The measuring apparatus also includes a pair of FETs (71,72) configured to switch between a first state and a second state, the first state constituting a circuit inputting the output of the measuring circuit into the power supply circuit, the second state constituting a circuit directly inputting the output of the measuring circuit into the CT, and a switching controller (122) driven by the power supply circuit to control the FETs. The switching controller controls the FETs such that the FETs is in the first state during waiting, and the switching controller controls the FETs such that the FETs is in the second state during measurement.
申请公布号 EP2975416(A1) 申请公布日期 2016.01.20
申请号 EP20140762751 申请日期 2014.01.22
申请人 OMRON CORPORATION 发明人 TOKUSAKI, HIROYUKI;IMAI, HIROSHI;OHNO, YASUKAZU;MATSUURA, KEIKI
分类号 G01R19/00;G01R15/18 主分类号 G01R19/00
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