发明名称 Method for probe equalization
摘要 A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.
申请公布号 EP2905625(A3) 申请公布日期 2016.01.20
申请号 EP20150151992 申请日期 2015.01.21
申请人 TEKTRONIX, INC. 发明人 PICKERD, JOHN;HAGERUP, WILLIAM;LAW, WILLIAM
分类号 G01R13/02;G01R1/067;G01R35/00 主分类号 G01R13/02
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