发明名称 CONTACTLESS RADIOWAVE DEVICE TO MEASURE THICKNESS OF DIELECTRIC MATERIALS
摘要 FIELD: electricity.SUBSTANCE: contactless radiowave device to measure thickness of dielectric materials comprises the first microwave oscillator, power divider, the first and second frequency multiplier, antennae for emission of electromagnetic waves normally towards surface of a dielectric plate and receipt of reflected waves, mixer, computing unit coupled to output of the mixer. The device comprises additionally the second microwave oscillator, a switch, the first circulator, which first output is connected to the first output of the power divider, the second output is connected to the first antenna, the third output via the second frequency multiplier is coupled to the first input of the mixer, the second circulator, which first output is connected to the second output of the power divider via the first frequency multiplier, the second output is coupled to the second antenna, the third output is connected to the second input of the mixer, at that the first and second microwave oscillators are coupled to the first and second inputs of the switch, control input of the switch is coupled to the computing unit while its output is coupled to input of the power divider.EFFECT: higher accuracy of measurement.1 dwg
申请公布号 RU2573627(C1) 申请公布日期 2016.01.20
申请号 RU20140145111 申请日期 2014.11.10
申请人 FEDERAL'NOE GOSUDARSTVENNOE BJUDZHETNOE UCHREZHDENIE NAUKI INSTITUT PROBLEM UPRAVLENIJA IM. V.A. TRAPEZNIKOVA ROSSIJSKOJ AKADEMII NAUK 发明人 KHABLOV DMITRIJ VLADILENOVICH
分类号 G01B15/02 主分类号 G01B15/02
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