| 摘要 |
PROBLEM TO BE SOLVED: To improve accuracy in defect detection in a defect detection method for a display area of a display device in which a plurality of pixels are regularly distributed at substantially the same pixel intervals.SOLUTION: A defect inspection method for a display device includes the steps of: determining first brightness in first image data that is an inspection point within an area on a screen 111 of a display device 110 obtained as imaging data on the basis of distortion information of the imaging data obtained by an imaging optical device 120, and coordinates of second image data from a compared pixel interval having information on a distance and direction determined on the basis of pixel intervals and the distortion information; and comparing the first brightness with second brightness in the second image data to obtain defect information. |
