发明名称 FORMING FENCE CONDUCTORS IN TRENCHES FORMED BY A SPACER ETCHING TECHNIQUE
摘要 A spacer etching process produces ultra-narrow conductive lines in a plurality of semiconductor dice. Trenches are formed in a first dielectric then a sacrificial film is deposited onto the first dielectric and the trench surfaces formed therein. Planar sacrificial film is removed from the face of the first dielectric and bottom of the trenches, leaving only sacrificial films on the trench walls. A gap between the sacrificial films on the trench walls is filled in with a second dielectric. A portion of the second dielectric is removed to expose tops of the sacrificial films. The sacrificial films are removed leaving ultra-thin gaps that are filled in with a conductive material. The tops of the conductive material in the gaps are exposed to create “fence conductors.” Portions of the fence conductors and surrounding insulating materials are removed at appropriate locations to produce desired conductor patterns comprising isolated fence conductors.
申请公布号 EP2973679(A1) 申请公布日期 2016.01.20
申请号 EP20140710754 申请日期 2014.03.01
申请人 MICROCHIP TECHNOLOGY INCORPORATED 发明人 FEST, PAUL
分类号 H01L21/768 主分类号 H01L21/768
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