发明名称 形状測定・校正装置
摘要 [Problem] To provide a shape measurement device that can measure both contours over a wide measurement range, and tiny asperities. [Solution] The shape measurement device is designed to measure surface contours and surface roughness of a measured surface, and is provided with an arm that swings about a support part as the fulcrum point; a sensing pin positioned contacting the measured surface, and experiencing vertical displacement according to the surface profile of the measured surface; and a displacement sensor and a scale type detector for detecting displacement due to swinging of the arm. The sensing pin is situated at a first end at one end of the arm, the displacement sensor and the scale type detector are at least partly situated at a second at the other end portion of the arm, and the support part is situated closer towards the second end side, with respect to the center of the arm.
申请公布号 JP5845373(B2) 申请公布日期 2016.01.20
申请号 JP20150149953 申请日期 2015.07.29
申请人 株式会社東京精密 发明人 山内 康弘;藤田 隆
分类号 G01B5/00;G01B5/20 主分类号 G01B5/00
代理机构 代理人
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