发明名称 WAFER CARRIER HAVING PROVISIONS FOR IMPROVING HEATING UNIFORMITY IN CHEMICAL VAPOR DEPOSITION SYSTEMS
摘要 A wafer carrier and methods of making the same for use in a system for growing epitaxial layers on one or more wafers by chemical vapor deposition. The wafer carrier includes wafer retention pockets recessed in its body. A thermally-insulating spacer is situated at least partially in the at least one wafer retention pocket and arranged to maintain a spacing between the peripheral wall surface and the wafer, the spacer being constructed from a material having a thermal conductivity less than a thermal conductivity of the wafer carrier such that the spacer limits heat conduction from portions of the wafer carrier body to the wafer. The wafer carrier further includes a spacer retention feature that engages with the spacer and includes a surface oriented to prevent centrifugal movement of the spacer when subjected to rotation about the central axis.
申请公布号 EP2973661(A1) 申请公布日期 2016.01.20
申请号 EP20140762924 申请日期 2014.03.14
申请人 VEECO INSTRUMENTS INC. 发明人 KRISHNAN, SANDEEP;QUINN, WILLIAM, E.;MONTGOMERY, JEFFREY, S.;MANGUM, JOSHUA;URBAN, LUKAS
分类号 H01L21/205;B23P19/04;C23C16/458;C30B25/12;H01L21/687 主分类号 H01L21/205
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