发明名称 半導体装置および半導体装置の研磨方法
摘要 A semiconductor device includes a semiconductor chip, and a grinding-processed layer laminated on one surface of the semiconductor chip. Further, the semiconductor device includes a sealing resin that seals the semiconductor chip and the grinding-processed layer; and a metal remaining-thickness checking portion provided adjacent to the grinding-processed layer, sealed by the sealing resin, and having a inclined plane that is inclined with respect to a laminating direction of the grinding-processed layer.
申请公布号 JP5846153(B2) 申请公布日期 2016.01.20
申请号 JP20130094063 申请日期 2013.04.26
申请人 トヨタ自動車株式会社 发明人 近藤 健;成岡 英樹;束原 肇
分类号 H01L23/48;H01L21/304 主分类号 H01L23/48
代理机构 代理人
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