| 摘要 |
A test interface unit connected to a test facility generating a test signal and a driving power source for testing a plurality of semiconductor elements and accessing the semiconductor elements comprises a BOST circuit unit and a switch circuit unit. The BOST circuit unit is connected to the test facility and the semiconductor elements, generates a second test signal resulted from upgrading of the test signal, and receives the driving power source while providing the second test signal to the semiconductor elements. The switch circuit unit is connected to the test facility and the semiconductor elements, and selectively switches and provides the power source which remains after the test facility provides the power source to the BOST circuit unit, to a portion of the semiconductor elements. |
