发明名称 METHOD AND SYSTEM FOR DETERMINING PARAMETER DISTRIBUTION, VARIANCE, OUTLIERS AND TRENDS IN SYSTEMS
摘要 <p>A system and method for generating statistical reports showing distribution, variance, outliers and trends for parameters across a set of systems is provided. The reports are generated based on audited data for each system that pertains to the parameters. A distribution report assesses the uniformity of the parameters of a population of systems and provides frequency distributions and statistics describing the data values from the analyzed systems. A variance report assesses the conformity of one or more target systems against a reference data set comprised of a set of baseline systems. The report compares each target system individually against the reference data set to measure the consistency of the target's parameters. A trend report shows trends in the uniformity and conformity measures of the parameters by comparing the statistical analysis results of sets of systems at two or more points in time or the different systems at the same time.</p>
申请公布号 CA2655547(C) 申请公布日期 2016.01.19
申请号 CA20072655547 申请日期 2007.06.22
申请人 CIRBA INC. 发明人 HILLIER, ANDREW D.;YUYITUNG, TOM
分类号 G06Q10/06;G06F17/18;G06Q10/10 主分类号 G06Q10/06
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