发明名称 Imprint method and imprint apparatus
摘要 According to one embodiment, an imprint method is provided. In the imprint method, minute objects adhering to a shot of a substrate, on which imprinting is next performed, are removed after delivering the substrate to the interior of an imprint apparatus and before dropping a resist onto the substrate. Thereafter, a resist is dropped onto the shot. Further, a template that is an original plate having a concave-convex pattern is brought into contact with the resist to form a resist pattern on the substrate according to the concave-convex pattern.
申请公布号 US9240336(B2) 申请公布日期 2016.01.19
申请号 US201414193705 申请日期 2014.02.28
申请人 Kabushiki Kaisha Toshiba 发明人 Takakuwa Manabu
分类号 H01L21/67;B29C43/00;G03F7/00 主分类号 H01L21/67
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. An imprint method comprising: delivering a substrate to an interior of an imprint apparatus, and placing the substrate on a sample stage; removing, before dropping a resist onto the substrate, minute objects adhering to a shot next-to-be-imprinted within the substrate that is placed on the sample stage; dropping the resist onto the shot; and bringing, into contact with the resist, a template that is an original plate having a concave-convex pattern to form a resist pattern on the substrate according to the concave-convex pattern.
地址 Minato-ku JP